Speaker:
Richard Tseng
ECE, UIUC
Title:
Using Statistical Device Models to Account for Process Variations
Abstract:
Due to increasing variability in submicron processes, statistical device models will soon join corner based device models as standard circuit design tools. Although statistical models have been around for a long time, it has not been clear how one should use them. Taiwan Semiconductor Manufacturing Company (TSMC) is spearheading research in the efficient use of statistical models. This talk will highlight current design methodology using statistical models. It will also cover TSMC's efforts to incorporate statistical models into statistical timing analysis.